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Bruker Nano Analytics TXRF — Ultra-Trace Elemental Analysis

Name: Bruker Nano Analytics TXRF — Ultra-Trace Elemental Analysis
Brand: Bruker Nano Analytics

Overview

Total-reflection X-ray fluorescence (TXRF) measures many elements at once, down to sub-ppb levels, from nanogram-to-microgram amounts of sample. A small drop of a liquid, a suspension or a dispersed powder is dried on a sample disc and excited at a grazing angle, so the background is far lower than in conventional XRF. Quantification uses an internal standard, without daily calibration.

Bruker offers two systems: the compact, transportable S2 PICOFOX, and the automated S4 T-STAR for high-volume routine work, with up to 90 sample discs. Neither needs gases, cooling water or other media.

Use Cases

Water and wastewater: trace and heavy metals in fresh water, wastewater and effluents.
Pharmaceuticals: elemental impurities and catalyst residues in active ingredients and additives.
Food, beverages and supplements: nutrients and contaminants such as Zn, Se, Mo and I, and food-safety screening.
Cosmetics and chemicals: trace and heavy metals in raw materials and finished products.
Environment and air: soils, sludges and airborne particulate matter (with the T-AERO package).
Biomedical research: essential and toxic metals in blood, urine, other body fluids and tissues.
Nanoparticles and thin films: composition of nanoparticles; the S4 T-STAR GIXRF option adds monolayers and layered samples.

Unique Benefits

Ultra-trace sensitivity: detection limits in the sub-ppb range.
Tiny samples: nanogram-to-microgram amounts are enough, which suits precious or scarce material.
Many elements in one run: all detectable elements are measured simultaneously (S2 PICOFOX: Al to U).
Simple quantification: internal-standard method, factory calibration, no daily recalibration and no memory effects.
Low running cost: no gases, cooling water or other media, and low power consumption.
Routine-ready: the S4 T-STAR runs automated QC and overnight batches of up to 90 samples.
Local support from Merkel: application advice, measurements on your own samples, installation, training and service in Israel.

Resources

Bruker Nano Analytics TXRF — Ultra-Trace Elemental Analysis

Bruker Nano Analytics TXRF — Ultra-Trace Elemental Analysis

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