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Bruker Nano Analytics Micro-XRF

Name: Bruker Nano Analytics Micro-XRF
Brand: Bruker Nano Analytics

Overview

Unique Range of Micro X-ray Fluorescence Spectrometers for Elemental Analysis.
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.

Use Cases

Coatings and plating: measuring layer thickness and composition without sectioning the part.
Contamination and inclusions: identifying what a foreign particle or inclusion actually is, and where it sits.
Materials verification: confirming alloy or material grade on incoming goods before they enter production.
Elemental mapping: showing how elements are distributed across a surface, not just which are present.
Irregular and small objects: non-homogeneous, oddly shaped or very small samples that defeat bulk analysis methods.
Geology, mining and cultural heritage: compositional analysis where the object cannot be damaged.

Unique Benefits

Non-destructive: the sample is not consumed, sectioned or prepared — it can go back into service or into the collection.
Spatially resolved: you learn what is present and where, which bulk techniques cannot tell you.
Little to no sample preparation: irregular shapes and rough surfaces can be measured as they are.
Complements CT rather than replacing it: micro-XRF identifies elemental composition; CT resolves internal structure. Different questions.
Local support from Merkel: demonstration on your own samples, installation, training and service in Israel.

Resources

Bruker Nano Analytics Micro-XRF

Bruker Nano Analytics Micro-XRF

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